Photoemission spectroscopy with fs-VUV radiation
نویسندگان
چکیده
Recently, lateral resolution of photoemission spectroscopy has been rapidly improving by several types of energy-filtered electron emission microscopes (PEEM) or by focused light sources.1–6) On the other hand, laser-based photoemission spectroscopy facilitates femtosecond time-resolution, revealing the dynamics of electrons and atoms on surfaces.7–11) The combination of lateral and temporal resolutions is the next step to be realized. Here, we present our plan to develop a time-resolved photoemission microspectrometer based on fs VUV laser radiation. In our plan, VUV light generated as the sixth harmonic of a titanium sapphire (Ti:Sa) laser of 100 fs pulse duration is focused on a sample surface, and photoelectrons are detected with a high-energy resolution time-of-flight (TOF) spectrometer. Our aim is to achieve a photoelectron energy resolution as high as 30meV. The high-energy resolution is crucial in photoemission spectroscopy of the valence band, because the photoemission features from surface states or adsorption-induced states frequently appear as sharp peaks whose widths are less than 100meV. This energy resolution is extremely difficult to achieve in a magnification electron lens system of PEEM.
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تاریخ انتشار 2002